IEEE International Conference on Microelectronic Test Structures

SJR Rank #20,381H-index: 24SJR: 0.227Best quartile: N/A
Publisher

Institute of Electrical and Electronics Engineers Inc.

Country

United States

Type

conference and proceedings

SJR by Edition

2022202500.060.120.180.24

Subject Categories

  • Electrical and Electronic EngineeringN/A

Areas: Engineering

Publication Statistics

2025 Docs3-Year DocsCitable Docs0306090120

Documents per Year

2022202509182736

Detailed Information

ISSN

1071-9032, 2158-1029

SJR Best Quartile

N/A

Region

Northern America

Citations per Document (2 years)

0.50

References per Document

10.32

Coverage

1988, 1993-2020, 2022-2025

Scope

No scope description available yet.

Metrics from SCImago Journal Rank 2025. View on SCImago