IEEE International Reliability Physics Symposium Proceedings

SJR Rank #12,771H-index: 64SJR: 0.461Best quartile: N/A
Publisher

Institute of Electrical and Electronics Engineers Inc.

Country

United States

Type

conference and proceedings

SJR by Edition

Only one SJR edition is available for this journal so far.

Subject Categories

  • Engineering (miscellaneous)N/A

Areas: Engineering

Most published research topics

Semiconductor materials and devicesIntegrated Circuits and Semiconductor Failure AnalysisElectronic Packaging and Soldering TechnologiesAdvancements in Semiconductor Devices and Circuit DesignCopper Interconnects and ReliabilityElectrostatic Discharge in Electronics3D IC and TSV technologiesSemiconductor materials and interfacesElectron and X-Ray Spectroscopy TechniquesSilicon and Solar Cell Technologies

Source: OpenAlex

Publication Statistics

2025 Docs3-Year DocsCitable Docs0150300450600

Documents per Year

Only one SJR edition is available for this journal so far.

Detailed Information

ISSN

1541-7026

SJR Best Quartile

N/A

Region

Northern America

Citations per Document (2 years)

1.64

References per Document

17.07

Coverage

1967, 1970, 2001-2006, 2008-2025

Scope

No scope description available yet.

Metrics from SCImago Journal Rank 2025. View on SCImago