IEEE International Test Conference (TC)
SJR Rank #10,225H-index: 84SJR: 0.580Best quartile: N/A
Publisher
Institute of Electrical and Electronics Engineers Inc.
Country
United States
Type
conference and proceedings
SJR by Edition
Subject Categories
- Applied MathematicsN/A
- Electrical and Electronic EngineeringN/A
Areas: Engineering · Mathematics
Most published research topics
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test SystemsRadiation Effects in ElectronicsAdvancements in PLL and VCO TechnologiesLow-power high-performance VLSI designVLSI and FPGA Design TechniquesAdvancements in Photolithography TechniquesAnalog and Mixed-Signal Circuit DesignSemiconductor materials and devices
Source: OpenAlex
Publication Statistics
Documents per Year
Detailed Information
ISSN
1089-3539
SJR Best Quartile
N/A
Region
Northern America
Citations per Document (2 years)
1.29
References per Document
17.06
Coverage
1989, 1992, 1995-2013, 2015-2025
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago