Journal of Micro/Nanopatterning, Materials and Metrology
SJR Rank #13,296H-index: 20SJR: 0.437Best quartile: Q2
Publisher
SPIE
Country
United States
Type
journal
SJR by Edition
Only one SJR edition is available for this journal so far.
Subject Categories
- Atomic and Molecular Physics, and OpticsQ2
- Condensed Matter PhysicsQ2
- Electrical and Electronic EngineeringQ2
- Mechanical EngineeringQ2
- Electronic, Optical and Magnetic MaterialsQ3
Areas: Engineering · Materials Science · Physics and Astronomy
Most published research topics
Advancements in Photolithography TechniquesNanofabrication and Lithography TechniquesIntegrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy TechniquesOptical Coatings and GratingsAdvanced MEMS and NEMS TechnologiesAdvanced Surface Polishing TechniquesPhotonic and Optical DevicesMechanical and Optical ResonatorsSemiconductor materials and devices
Source: OpenAlex
Publication Statistics
Documents per Year
Only one SJR edition is available for this journal so far.
Detailed Information
ISSN
2708-8340
SJR Best Quartile
Q2
Region
Northern America
Citations per Document (2 years)
2.35
References per Document
23.60
Coverage
2014, 2021-2025
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago