Conference Proceedings from the International Symposium for Testing and Failure Analysis
SJR Rank #28,451H-index: 23SJR: 0.118Best quartile: N/A
Publisher
ASM International
Country
United States
Type
conference and proceedings
SJR by Edition
Only one SJR edition is available for this journal so far.
Subject Categories
- Control and Systems EngineeringN/A
- Electrical and Electronic EngineeringN/A
- Safety, Risk, Reliability and QualityN/A
Areas: Engineering
Most published research topics
Integrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and devicesVLSI and Analog Circuit TestingIndustrial Vision Systems and Defect DetectionForce Microscopy Techniques and ApplicationsAdvanced Surface Polishing TechniquesAdvancements in Photolithography TechniquesElectronic Packaging and Soldering TechnologiesAdvanced Electron Microscopy Techniques and Applications
Source: OpenAlex
Publication Statistics
Documents per Year
Only one SJR edition is available for this journal so far.
Detailed Information
ISSN
0890-1740
SJR Best Quartile
N/A
Region
Northern America
Citations per Document (2 years)
0.21
References per Document
0.00
Coverage
1998-2002, 2005-2015, 2017-2019, 2024
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago