IEEE International Integrated Reliability Workshop Final Report
SJR Rank #23,288H-index: 19SJR: 0.180Best quartile: N/A
Publisher
Institute of Electrical and Electronics Engineers Inc.
Country
United States
Type
conference and proceedings
SJR by Edition
Only one SJR edition is available for this journal so far.
Subject Categories
- Electrical and Electronic EngineeringN/A
- Electronic, Optical and Magnetic MaterialsN/A
- Safety, Risk, Reliability and QualityN/A
Areas: Engineering · Materials Science
Most published research topics
Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure AnalysisCopper Interconnects and ReliabilityFerroelectric and Negative Capacitance DevicesSilicon Carbide Semiconductor TechnologiesAdvanced Memory and Neural ComputingThin-Film Transistor TechnologiesSemiconductor materials and interfacesElectrostatic Discharge in Electronics
Source: OpenAlex
Publication Statistics
Documents per Year
Only one SJR edition is available for this journal so far.
Detailed Information
ISSN
2374-8036, 1930-8841
SJR Best Quartile
N/A
Region
Northern America
Citations per Document (2 years)
0.57
References per Document
0.00
Coverage
1993, 2002-2024
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago