Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
SJR Rank #15,694H-index: 41SJR: 0.347Best quartile: N/A
Publisher
Institute of Electrical and Electronics Engineers Inc.
Country
United States
Type
conference and proceedings
SJR by Edition
Only one SJR edition is available for this journal so far.
Subject Categories
- Electrical and Electronic EngineeringN/A
- Hardware and ArchitectureN/A
- Safety, Risk, Reliability and QualityN/A
- Signal ProcessingN/A
Areas: Computer Science · Engineering
Publication Statistics
Documents per Year
Only one SJR edition is available for this journal so far.
Detailed Information
ISSN
2576-1501, 2765-933X
SJR Best Quartile
N/A
Region
Northern America
Citations per Document (2 years)
1.34
References per Document
19.09
Coverage
2021-2025
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago