Proceedings of the European Test Workshop

SJR Rank #13,611H-index: 20SJR: 0.424Best quartile: N/A
Publisher

Institute of Electrical and Electronics Engineers Inc.

Country

United States

Type

conference and proceedings

SJR by Edition

Only one SJR edition is available for this journal so far.

Subject Categories

  • Electrical and Electronic EngineeringN/A
  • Industrial and Manufacturing EngineeringN/A
  • SoftwareN/A

Areas: Computer Science · Engineering

Most published research topics

VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in ElectronicsEmbedded Systems Design TechniquesAdvancements in Photolithography TechniquesAdvancements in PLL and VCO TechnologiesRadio Frequency Integrated Circuit DesignLow-power high-performance VLSI designInterconnection Networks and Systems3D IC and TSV technologies

Source: OpenAlex

Publication Statistics

2025 Docs3-Year DocsCitable Docs04590135180

Documents per Year

Only one SJR edition is available for this journal so far.

Detailed Information

ISSN

1530-1877, 1558-1780

SJR Best Quartile

N/A

Region

Northern America

Citations per Document (2 years)

1.72

References per Document

23.50

Coverage

1993, 2000-2003, 2016-2025

Scope

No scope description available yet.

Metrics from SCImago Journal Rank 2025. View on SCImago