IEEE Design and Test

SJR Rank #12,533H-index: 89SJR: 0.471Best quartile: Q2
Publisher

IEEE Computer Society

Country

United States

Type

journal

SJR by Edition

2022202500.150.30.450.6

Subject Categories

  • Electrical and Electronic EngineeringQ2
  • Hardware and ArchitectureQ2
  • SoftwareQ2

Areas: Computer Science · Engineering

Most published research topics

VLSI and Analog Circuit TestingDiverse Scientific and Economic StudiesHuman auditory perception and evaluationFerroelectric and Negative Capacitance DevicesIntegrated Circuits and Semiconductor Failure AnalysisPhysical Unclonable Functions (PUFs) and Hardware SecurityAdvanced Memory and Neural ComputingEducational Robotics and EngineeringParallel Computing and Optimization TechniquesEmbedded Systems Design Techniques

Source: OpenAlex

Publication Statistics

2025 Docs3-Year DocsCitable Docs065130195260

Documents per Year

202220250306090120

Detailed Information

ISSN

2168-2364, 2168-2356

SJR Best Quartile

Q2

Region

Northern America

Citations per Document (2 years)

1.62

References per Document

16.73

Coverage

2013-2026

Scope

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

Metrics from SCImago Journal Rank 2025. View on SCImago