IEEE Design and Test
IEEE Computer Society
United States
journal
SJR by Edition
Subject Categories
- Electrical and Electronic EngineeringQ2
- Hardware and ArchitectureQ2
- SoftwareQ2
Areas: Computer Science · Engineering
Most published research topics
Source: OpenAlex
Publication Statistics
Documents per Year
Detailed Information
ISSN
2168-2364, 2168-2356
SJR Best Quartile
Q2
Region
Northern America
Citations per Document (2 years)
1.62
References per Document
16.73
Coverage
2013-2026
Scope
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
Metrics from SCImago Journal Rank 2025. View on SCImago