Microscopy and Microanalysis
SJR Rank #16,591H-index: 85SJR: 0.318Best quartile: Q3APC: US$3,554
Journal website: aims, scope and author guidelinesPublisher
Oxford University Press
Country
United Kingdom
Type
journal
SJR by Edition
Subject Categories
- InstrumentationQ3
Areas: Physics and Astronomy
Most published research topics
Electron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsAdvanced Materials Characterization TechniquesIon-surface interactions and analysisIntegrated Circuits and Semiconductor Failure AnalysisForce Microscopy Techniques and ApplicationsAdvanced X-ray Imaging TechniquesElectronic and Structural Properties of OxidesX-ray Spectroscopy and Fluorescence AnalysisMachine Learning in Materials Science
Source: OpenAlex
Publication Statistics
Documents per Year
Detailed Information
ISSN
1431-9276, 1435-8115
SJR Best Quartile
Q3
Region
Western Europe
Citations per Document (2 years)
0.58
References per Document
46.21
Coverage
1995-2026
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago