IEEE Transactions on Instrumentation and Measurement

SJR Rank #2,351H-index: 176SJR: 1.527Best quartile: Q1APC: US$2,645
Journal website: aims, scope and author guidelines
Publisher

Institute of Electrical and Electronics Engineers Inc.

Country

United States

Type

journal

SJR by Edition

2022202500.40.81.21.6

Subject Categories

  • Electrical and Electronic EngineeringQ1
  • InstrumentationQ1

Areas: Engineering · Physics and Astronomy

Most published research topics

Sensor Technology and Measurement SystemsAdvanced Electrical Measurement TechniquesMachine Fault Diagnosis TechniquesFault Detection and Control SystemsMicrowave and Dielectric Measurement TechniquesNon-Destructive Testing TechniquesAnalog and Mixed-Signal Circuit DesignScientific Measurement and Uncertainty EvaluationAdvanced Fiber Optic SensorsIndoor and Outdoor Localization Technologies

Source: OpenAlex

Publication Statistics

2025 Docs3-Year DocsCitable Docs02000400060008000

Documents per Year

2022202501500300045006000

Detailed Information

ISSN

0018-9456, 1557-9662

SJR Best Quartile

Q1

Region

Northern America

Citations per Document (2 years)

7.52

References per Document

40.21

Coverage

1963-2026

Scope

Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.

Metrics from SCImago Journal Rank 2025. View on SCImago