Conference Record - IEEE Instrumentation and Measurement Technology Conference

SJR Rank #19,410H-index: 45SJR: 0.247Best quartile: N/A
Publisher

Institute of Electrical and Electronics Engineers Inc.

Country

United States

Type

conference and proceedings

SJR by Edition

2022202500.0650.130.1950.26

Subject Categories

  • Electrical and Electronic EngineeringN/A
  • InstrumentationN/A

Areas: Engineering · Physics and Astronomy

Most published research topics

Sensor Technology and Measurement SystemsAdvanced Electrical Measurement TechniquesAnalog and Mixed-Signal Circuit DesignNon-Destructive Testing TechniquesFault Detection and Control SystemsControl Systems and IdentificationAdvanced MEMS and NEMS TechnologiesFlow Measurement and AnalysisVLSI and Analog Circuit TestingMicrowave and Dielectric Measurement Techniques

Source: OpenAlex

Publication Statistics

2025 Docs3-Year DocsCitable Docs02505007501000

Documents per Year

20222025075150225300

Detailed Information

ISSN

1091-5281

SJR Best Quartile

N/A

Region

Northern America

Citations per Document (2 years)

0.98

References per Document

19.04

Coverage

1991, 1993-2008, 2011, 2013-2016, 2019, 2021-2025

Scope

No scope description available yet.

Metrics from SCImago Journal Rank 2025. View on SCImago