Proceedings of the IEEE VLSI Test Symposium
SJR Rank #14,360H-index: 61SJR: 0.394Best quartile: N/A
Publisher
IEEE Computer Society
Country
United States
Type
conference and proceedings
SJR by Edition
Subject Categories
- Computer Science ApplicationsN/A
- Electrical and Electronic EngineeringN/A
Areas: Computer Science · Engineering
Most published research topics
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in ElectronicsLow-power high-performance VLSI designVLSI and FPGA Design TechniquesSemiconductor materials and devicesAdvancements in Photolithography TechniquesAdvancements in Semiconductor Devices and Circuit DesignAdvancements in PLL and VCO TechnologiesRadio Frequency Integrated Circuit Design
Source: OpenAlex
Publication Statistics
Documents per Year
Detailed Information
ISSN
2375-1053
SJR Best Quartile
N/A
Region
Northern America
Citations per Document (2 years)
1.55
References per Document
24.92
Coverage
1991-1992, 1994-2025
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago