Proceedings of the Asian Test Symposium
SJR Rank #23,290H-index: 36SJR: 0.180Best quartile: N/A
Publisher
IEEE Computer Society
Country
United States
Type
conference and proceedings
SJR by Edition
Subject Categories
- Electrical and Electronic EngineeringN/A
Areas: Engineering
Most published research topics
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test SystemsRadiation Effects in ElectronicsSoftware Testing and Debugging TechniquesVLSI and FPGA Design TechniquesEmbedded Systems Design TechniquesAdvancements in PLL and VCO TechnologiesPhysical Unclonable Functions (PUFs) and Hardware SecuritySemiconductor materials and devices
Source: OpenAlex
Publication Statistics
Documents per Year
Detailed Information
ISSN
1081-7735
SJR Best Quartile
N/A
Region
Northern America
Citations per Document (2 years)
0.55
References per Document
0.00
Coverage
1993-2016, 2018-2024
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago