Electronic Device Failure Analysis
SJR Rank #29,152H-index: 7SJR: 0.112Best quartile: Q4
Publisher
ASM International
Country
United States
Type
journal
SJR by Edition
Subject Categories
- Electrical and Electronic EngineeringQ4
- Safety, Risk, Reliability and QualityQ4
Areas: Engineering
Most published research topics
Integrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit TestingElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and devicesIndustrial Vision Systems and Defect DetectionAdvanced Surface Polishing TechniquesForce Microscopy Techniques and Applications3D IC and TSV technologiesIon-surface interactions and analysisElectronic Packaging and Soldering Technologies
Source: OpenAlex
Publication Statistics
Documents per Year
Detailed Information
ISSN
1537-0755
SJR Best Quartile
Q4
Region
Northern America
Citations per Document (2 years)
0.19
References per Document
6.05
Coverage
2001, 2004-2025
Scope
No scope description available yet.
Metrics from SCImago Journal Rank 2025. View on SCImago